The new NSG 3060 test generator from Teseq, Inc. is characterized by an innovative modular architecture that provides system configurations that meet the needs of both basic and sophisticated testing procedures. A user-friendly interface has a 7-inch high-contrast, color touch screen and graphics that enable quick test set-ups. The device provides a surge voltage of up to 6.6 kV for testing of combination wave, ring wave, and EFT pulses as well as burst, dip/interrupt, and magnetic field applications. Powerful processors satisfy the unique coupling requirements specified by ANSI C62.41 so the system is compatible with both ANSI and IEC coupling methods. The touch panel display enables the creation of multi-step test procedures, programming of ramp functions, and easy changes to sequence or parameter values. Standardized tests can be configured with a few clicks using the integrated DTA (digital test access) function. Find additional product details in the Teseqpress release.