This is post 2 of AR’s blog series “Specifying RF/Microwave Power Amplifiers for EMC Testing.” The full series can be viewed here. INTRODUCTION How much input power is required to achieve full rated output power is a common concern when choosing an amplifier. Amplifier manufacturers have specified an input of 1 milliwatt. (Note that this is not the case for every … [Read more...]
Introduction to Specifying RF/Microwave Power Amplifiers for EMC Testing
Can you imagine a world without electronic devices? AR asks and answers this question in its new blog series: “Specifying RF/Microwave Power Amplifiers for EMC Testing.” Explosive growth in technologies like portable electronics, Internet-of-Things devices, and autonomous vehicles has led to a world full of electromagnetic interference. Efficient EMC testing is more critical … [Read more...]
Review of MIL-STD-461 RE103 Antenna Spurious and Harmonic Outputs
Introduction Technology frequently embeds transmitters in a myriad of devices to support an Internet Of Things (IoT) concept from identification to condition-based actions, and this IoT approach includes defense operations. Devices may include multiple transmitters that a few years ago did not include communications of any sort. Inclusion of RF transmitters has prompted a … [Read more...]
Review of MIL-STD-461 CS103 Intermodulation, CS104 Rejection of Undesired Signals and CS105 Cross-Modulation
Introduction Rapid technology advances in the wireless communications world make test and evaluation of Radio Frequency (RF) devices a difficult subject. It seems that by the time a new device hits the market, it has been made obsolete by the next generation. I recall hearing from a major electronics manufacturer CEO that 90% of sales happen within 90-days of market release … [Read more...]
Review of MIL-STD-461 CS117 Lightning Induced Transients, Cables and Power Leads
Introduction Lightning may produce a spectacular display when viewed, but the associated electromagnetic effects (EME) has the potential (pun intended) to severely damage electrical and electronic circuits. MIL-STD-461G added a new test method to evaluate device tolerance for induced current on equipment cables or insulation breakdown from the effects of indirect lightning. … [Read more...]
The Top-Ten Articles and Blogs as of December 2018
Most magazines like to review the top ten most viewed articles this time of year and Interference Technology is no different. We think our readers and authors are awesome and enjoy highlighting some of the most popular articles to date. So, here we go: What is differential and common mode current, by Ron Brewer. Unwanted conductive and radiative emissions can be … [Read more...]
Mini Burst Field Generator (E)
The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset, Clock, Quartz or the respective signal lines. The extremely thin tip of P23 is suitable for testing the finest structures. The coupling takes place capacitively inside the field generator. The tip of the P23 Mini Burst Field Generator is positioned galvanically on the pin … [Read more...]
Optical Sensor AS 350, Analog ± 50 V DC
Optical Sensor AS 350, Analog ± 50 V DC for the potential-free transmission of analog signals from the test object during interference Also new in the product range since this year is the AS 350. The optical analogue probe allows a non-reactive transmission of analogue signals from a test object during interference. The measuring range is ± 50V, the irradiance at> 200 V / … [Read more...]
Probes for Pulse Injection into IC-Die for Immunity Testing and Side Channel Analysis
The Langer EMC technology is pleased to inform you that you can now perform highly accurate immunity tests on the IC die. The ICI L-EFT set consists of a variety of ICI field sources that couple electrical, magnetic fields or contacted current pulses into an open die. This enables a high-precision and high-resolution IC analysis. Furthermore, side channel attacks can be … [Read more...]
ATEC Provides Solution for IEC/EN 61000-4-31, with Teseq NSG 4031
San Diego, Ca. – October 2, 2018 – Advanced Test Equipment Rentals (ATEC), today announced ATEC provides solution for IEC/EM 61000-4-31, with Teseq NSG 4031. The NSG 4031 broadband immunity test systems are designed for conducted immunity testing in accordance with IEC/EN 61000-4-31. ATEC is the leading rental provider of test equipment for EMC, aerospace, automotive, … [Read more...]
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