The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset, Clock, Quartz or the respective signal lines. The extremely thin tip of P23 is suitable for testing finest structures.
The coupling takes place capacitively inside the field generator. The tip of the P23 mini burst field generator is positioned galvanically on the pin or signal line under test. Conventional generators and test stations can be used to determine whether a device complies with the standard noise immunity required by law. However, weak spots on an assembly can not be precisely located. Detailed information about the weak spot`s location, the susceptibility and type of action (E or B field susceptibility) are required to eliminate them at the source in the most straightforward way. The handy mini burst field generators are always at hand and any electronic developer can use them for tests at the workplace.