Probes for Pulse Injection into IC-Die for Immunity Testing and Side Channel Analysis

The Langer EMC technology is pleased to inform you that you can now perform highly accurate immunity tests on the IC die.

The ICI L-EFT set consists of a variety of ICI field sources that couple electrical, magnetic fields or contacted current pulses into an open die.
This enables a high-precision and high-resolution IC analysis.
Furthermore, side channel attacks can be simulated to test safety-critical circuits. The special features include a very high-resolution 500μm probe tip, which allows the examination of extremely small areas. In addition, the probes have a very low trigger-to-pulse jitter, which allows a disturbance of very specific points in the program flow.

Langer EMV-Technik manufactures high resolution IC measurement tools for IC analysis in the developmental stage. We would like to share information about a new product, which is being used to detect and guarantee IC safety and security.

The ICI L-EFT set consists of up to a variety of ICI probes emitting electric or magnetic field or current pulses into an open die. This allows high precision and very high resolution IC analysis.

Side channel attacks can be simulated to test security-critical circuits. Special features include a very high resolution 500µm probe tip (allowing for the testing of extremely small areas) and a very low trigger to pulse jitter (allowing for the disruption of very specific points in the program sequence).