A group of three engineers has been selected as recipients of the Society of Automotive Engineers (SAE) International’s Vincent Bendix Automotive Electronics Award. The awards presentation will take place during the SAE 2009 World Congress Awards Ceremony slated for April 21 at the Marriott Renaissance Center in Detroit, MI. The award, established in 1976, recognizes the … [Read more...]
Course: European EMC Automotive Regulations
This one-day course will cover the automotive EMC environment, the history behind automotive EMC directives, approval and marking requirements, emissions and immunity requirements, and relevant standards.The presenter is Dr. Ian Noble, and the course fee is £45 plus VAT. The registration (booking) form and additional information is available … [Read more...]
Participation and Input Sought
The IEEE Southeastern Michigan EMC Society is exploring the idea of holding “Automotive EMC Lab Best Practices” workshops. This plan is based on the premise that every lab uses various tips, tricks, custom software, and custom-built devices that help to speed up or otherwise improve EMC testing. Possible lines of thought include the “real story” on calibration, experiences with … [Read more...]
Automotive EMC Testing “Tech Tour” Slated for Dearborn, MI
A special half-day seminar focusing on automotive EMC testing will take place on Wednesday, September 17, 2008 at the University of Michigan, Dearborn Campus. Speakers will include Lee Hill and Randall Vaughn of SILENT, Garth D’Abreu of ETS-Lindgren, and Vic Hudson of Rohde & Schwarz. A discussion panel will include Keith Frazier of Ford, Don Seyerle from General Motors, … [Read more...]
Chip Provides EMI and ESD Protection for Vehicle Networks
The new LIN SBC (system basic chip) family from Freescale Semiconductor has been crafted to provide both EMC and ESD performance for LIN® (local interconnect network) vehicle networks. This family features three highly integrated, pin-compatible devices. The MC33910G5 combines power management capabilities that contribute to low battery discharge during low-power modes, a … [Read more...]
BMW Celebrates April 1
Automaker BMW’s UK branch placed ads in several media outlets on April 1 touting its latest fuel-saving models equipped with Magnetic Tow Technology (MMT). Drivers of specially equipped models simply pull behind a suitable vehicle on the highway and activate a special electromagnetic beam that allows the vehicle to be towed by the car in front. The driver of the BMW simply … [Read more...]
MILMEGA to make presentation to South Eastern Michigan EMC chapter
USA Sales Manager Tom Mullineaux will be making a presentation to the South Eastern Michigan IEEE EMC Chapter on generating and calibrating 600v/m automotive test fields in an ALSE chamber.Scheduled for March 19th 2009, the presentation looks at possible antenna /amplifier combinations for generating 600 v/m @1m test distance, and looks at field calibration methods that avoid … [Read more...]
S.E. Michigan IEEE EMC Society Slates Session on Automotive Component Testing
The Southeastern Michigan IEEE EMC Society has slated a session on “600 V/m Field Generation and Field Calibration for Automotive Component Testing” on Thursday, March 19, 2009 at 5:30 pm at the University of Michigan, School of Management, Fairlane Center North, Dearborn, MI. Featured presenter is Thomas Mullineaux of MILMEGA, Limited.Registration is available through the … [Read more...]
Test Transmission System Targets Demanding Applications
The DOtech product line from Germany-based NK-Elektronik are test transmission systems consisting of two send/receive units connected by an fiber optic cable transmission lines. Signals can be transmitted in both directions. The digital transmission lines boast freedom from potentials, negligible emissions, and high immunity to electromagnetic fields and interfering currents. … [Read more...]
Achieving More Accurate Measurement of Conducted RF Emissions Using Modified AMNs
Measurement uncertainty for common-mode disturbances can be reduced from about 22 dB to a maximum of a few dB Mart Coenen, Philips Applied Technologies Eindhoven, the Netherlands Introduction In early 1980, extensive discussions were held within the IEC CISPR/A working group regarding the definition of the impedance characteristics and the RF emission limits attained via the … [Read more...]
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