A special half-day seminar focusing on automotive EMC testing will take place on Wednesday, September 17, 2008 at the University of Michigan, Dearborn Campus. Speakers will include Lee Hill and Randall Vaughn of SILENT, Garth D’Abreu of ETS-Lindgren, and Vic Hudson of Rohde & Schwarz. A discussion panel will include Keith Frazier of Ford, Don Seyerle from General Motors, and Rob Kado from Chrysler. The program includes training sessions, demonstrations, a closer look at the basic principles underlying automotive EMC, and an examination of pitfalls to be avoided. This session is part of the “Tech Tour” project, which holds half-day practical seminars for working professionals in major cities throughout the Americas. For more information and online registration go to the “Tech Tour” website.
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Interference Technology
Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.
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