The E1 interference immunity development system is an ideal resource to optimize the EMC characteristics of modules in the final development phase. The E1 allows the developer to analyze interference current paths, locate faults in the layout using the field sources and at the same time monitor logic signals from the device under test as well as measure magnetic fields due to burst.
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Interference Technology
Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.