The NSG 3040 System generates electrical fast transient (EFT), surge, and power quality (PQT) tests. It easily fulfills CE Mark testing needs as it is fully compliant to the latest versions of IEC/EN 61000-4-4, -4-5, and -4-11. The NSG 3040 system can perform EFT tests to 4.8 kV and combination wave surges to 4.4 kV, and it can perform dip and interrupt testing. An internal coupling and decoupling network allows testing on AC and DC power lines of up to 260 V and 16 amps. Another product feature includes a unique master-slave concept, which enables pulse generator modules to be added to the original system configuration, a capability that allows for the separate calibration of these modules. The calibration data and correction factors can then be stored separately on the slave controller. New modules can be installed easily without returning the entire system for calibration. Additional product features include an innovative modular architecture that can be configured for the most basic or sophisticated testing needs, a user-friendly interface with high contrast, easy triggering of standardized tests with just a few clicks, and inputs supported by either an integrated keyboard or thumbwheel. The system features a standard secure digital (SD) memory card reader, and a wide range of accessories for optional needs is available as well. For more information on Teseq test systems, visit thewww.teseq.comor contact Mary Jane Salvador atmail to:maryjane.salvador@teseq.com
New 4-kV EMC Test System Complies with Latest IEC/EN Requirements
