For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E™ 5300 general-purpose test environment. The DC to 40 GHz SMART^E™ 5300 tests, monitors, and controls any Device Under Test (DUT) within a single test environment. SMART^E™ 5300 is designed for parametric and functional testing in the military/aerospace and high-performance commercial markets. The system is ideal for customers with one or more of these demanding RF/microwave test requirements:· High throughput production;· Large number of unique tests per DUT;· Highly repetitive tests per DUT;· Product lines requiring rapid software reconfiguration of test systems;· Replacement of racks of older or obsolete equipment with a “synthetic” or software defined test environment.Get more information from Aeroflex.
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Interference Technology
Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.