The P23`s interference pulse runs through and couples to the digital IC inputs under test, like Reset, Clock, Quartz or the respective signal lines. The extremely thin tip of P23 is suitable for testing the finest structures. The coupling takes place capacitively inside the field generator. The tip of the P23 Mini Burst Field Generator is positioned galvanically on the pin … [Read more...]

Optical Sensor AS 350, Analog ± 50 V DC for the potential-free transmission of analog signals from the test object during interference Also new in the product range since this year is the AS 350. The optical analogue probe allows a non-reactive transmission of analogue signals from a test object during interference. The measuring range is ± 50V, the irradiance at> 200 V / … [Read more...]

The Langer EMC technology is pleased to inform you that you can now perform highly accurate immunity tests on the IC die. The ICI L-EFT set consists of a variety of ICI field sources that couple electrical, magnetic fields or contacted current pulses into an open die. This enables a high-precision and high-resolution IC analysis. Furthermore, side channel attacks can be … [Read more...]

San Diego, Ca. – October 2, 2018 – Advanced Test Equipment Rentals (ATEC), today announced ATEC provides solution for IEC/EM 61000-4-31, with Teseq NSG 4031. The NSG 4031 broadband immunity test systems are designed for conducted immunity testing in accordance with IEC/EN 61000-4-31. ATEC is the leading rental provider of test equipment for EMC, aerospace, automotive, … [Read more...]

San Diego, CA – September 25, 2018–  Advanced Test Equipment Rentals (ATEC), today announced that ATEC expands battery test system rental inventory with the Arbin LBT21024. The Arbin LBT Battery Cycler is a battery testing system for basic charge/discharge cycling, and simulating complex real-world applications such as drive profiles, telecom pulses, or other custom … [Read more...]