USA Sales Manager Tom Mullineaux will be making a presentation to the South Eastern Michigan IEEE EMC Chapter on generating and calibrating 600v/m automotive test fields in an ALSE chamber.Scheduled for March 19th 2009, the presentation looks at possible antenna /amplifier combinations for generating 600 v/m @1m test distance, and looks at field calibration methods that avoid … [Read more...]
S.E. Michigan IEEE EMC Society Slates Session on Automotive Component Testing
The Southeastern Michigan IEEE EMC Society has slated a session on “600 V/m Field Generation and Field Calibration for Automotive Component Testing” on Thursday, March 19, 2009 at 5:30 pm at the University of Michigan, School of Management, Fairlane Center North, Dearborn, MI. Featured presenter is Thomas Mullineaux of MILMEGA, Limited.Registration is available through the … [Read more...]
Test Transmission System Targets Demanding Applications
The DOtech product line from Germany-based NK-Elektronik are test transmission systems consisting of two send/receive units connected by an fiber optic cable transmission lines. Signals can be transmitted in both directions. The digital transmission lines boast freedom from potentials, negligible emissions, and high immunity to electromagnetic fields and interfering currents. … [Read more...]
Achieving More Accurate Measurement of Conducted RF Emissions Using Modified AMNs
Measurement uncertainty for common-mode disturbances can be reduced from about 22 dB to a maximum of a few dB Mart Coenen, Philips Applied Technologies Eindhoven, the Netherlands Introduction In early 1980, extensive discussions were held within the IEC CISPR/A working group regarding the definition of the impedance characteristics and the RF emission limits attained via the … [Read more...]
Building a State-of-the-Art 5-Meter Chamber
An efficient shield room for automotive testing progresses from design to finished structure Michael Koffink, Bob Mitchell Intertek ETL Semko Littleton, MA Four years ago, we noticed a growing demand for EMC testing from the automotive industry. As cars and trucks now feature myriad on-board electronic devices, they are increasingly susceptible to stray emissions while … [Read more...]
Reverberation Chamber for EMC Testing
The reverberation chamber provides the most realistic simulation/equivalency for electronics functioning within a cavity Er-Ping Li, Ph.D.; Xing-Chang Wei, Ph.D., Electromagnetic Labs, Singapore National Institute of High Performance Computing Singapore Introduction The problem is familiar, but growing. The widespread and ever-growing use of electronic devices with high-speed … [Read more...]
Expanded Amplifier Line Delivers Reliable Performance in Demanding Environments
Five new broadband power amplifiers from Teseq operate from 0.8 GHz to 3.1 GHz and from 2 GHz to 6 GHz with power levels ranging from 30 W to 450 W. Three Class A models are based on gallium arsenide (GaAs) integrated circuit (IC) technology and offer significantly better compression characteristics and increased efficiencies than earlier silicon-based low power amplifiers. The … [Read more...]
Product Environmental Regulatory Compliance: The Current Status Worldwide
The drive to protect the environment and to conserve natural resources has brought about a proliferation of regulations Tony Dibiase As the clamor for better and newer electronic products continues worldwide, there is increased concern over landfills accepting growing “mountains” of discarded electronic products. Consequently, global environmental regulatory compliance … [Read more...]
Test Beyond the Specs: Why Test Higher in Frequency and Field Strength?
IEC 61000-4-3: 2006’s frequency escalation Jason Smith and Pat Malloy, AR RF/Microwave Instrumentation Souderton, PA An increasing number of new and proposed EMC standards are pushing the upper frequency test limits higher into the microwave spectrum. The latest EMC standard released, IEC 61000-4-3: 2006, is no exception. The upper frequency test limit has been increased from … [Read more...]
Time Domain Measurement System Processes Signals in Real Time
The TDEMI 3G systems is the latest addition to the TDEMI family of test instruments from Germany’s GAUSS Instruments. The system digitizes the EMI signal using an analog-to-digital unit. Simultaneously, the TDEMI 3G provides several thousand digitally simulated EMI receivers working in parallel—via an FFT-based bank of filters and parallel detectors. An extended measurement … [Read more...]
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