High-performance, High-speed RF and Microwave Testing

For high-performance, high-speed testing of RF and microwave devices, Aeroflex introduces the SMART^E™ 5300 general-purpose test environment. The DC to 40 GHz SMART^E™ 5300 tests, monitors, and controls any Device Under Test (DUT) within a single test environment. SMART^E™ 5300 is designed for parametric and functional testing in the military/aerospace and high-performance commercial markets. The system is ideal for customers with one or more of these demanding RF/microwave test requirements:·         High throughput production;·         Large number of unique tests per DUT;·         Highly repetitive tests per DUT;·         Product lines requiring rapid software reconfiguration of test systems;·         Replacement of racks of older or obsolete equipment with a “synthetic” or software defined test environment.Get more information from Aeroflex.