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Simplified Measurement of Radiated Spurious Emissions on LTE Devices

February 6, 2012 Interference Technology Filters / Ferrites, Products, Technologies

Rohde & Schwarz is taking a completely new approach to measuring radiated spurious emissions on LTE devices, making it considerably easier for users to measure RSE in the presence of LTE carrier power. The solution is the R&S OSP open switch and control platform equipped with the new R&S OSP-B155 option – at a price no higher than that of a conventional test setup with notch filters. The Rohde & Schwarz solution requires only two height units in the control cabinet. The new R&S OSP-B155 plug-in module shifts the entire received signal spectrum into the optimum power range to allow full use of the dynamic range of the connected EMI test receiver. The receiver can analyze the entire LTE signal spectrum without requiring a notch filter.Learn more from Rohde & Schwarz.

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Interference Technology

Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.

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Interference Technology

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