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Philadelphia IEEE EMC Chapter Wins Award

News, Technologies, Testing

Selected from almost 20 IEEE chapters in the region, the Philadelphia Chapter of the IEEE EMC Society received the award last Saturday, April 4th for “Outstanding Chapter of the Year” in the Philadelphia/Delaware Valley IEEE region. The Annual Awards Banquet and Gala was held at the historic Union League in Philadelphia. Representing the chapter were Graham Kilshaw, Chair and President of ITEM Publications seen accepting the award; Vice Chair Fin O’Connor of Alion Sciences; and Richard Reitz, Joe Maiello, and Ron Wilson of Retlif Testing. The speaker for the evening was the Hon. Alene Ammond, Past NJ State Senator, and IEEE Philadelphia Section Chair Jack Nachamkin, pictured with Graham Kilshaw.

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Interference Technology

Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.

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