Title: IEEE-HIT Electromagnetic Compatibility (EMC) Conference
Date: May 03 2016
Location: Holon institute of Technology, Holon, Israel
Description: The HIT 2016 conference of EMC, held under IEEE Israel, provides a concentrated gathering for EMC professionals of all levels and specialties from both academia and industry. Interference problems and the need for compatibility of electrical systems with their environment are not new, but the rapid development of new high speed electrical systems, signifies the crucial role of EMC in modern industry, ever than before.
Following the highly successful 2015 HIT EMC conference and exhibition, the 2016 conference offers keynotes, lectures, posters and exhibition covering the whole scope of EMC, including emerging technologies related to EMC. The conference will address both traditional and emerging issues of EMC and related, antennas and RF communications.
Paper submissions are due March 31, 2016.
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