EMC Live 2015 Test Bootcamp is a 1-day, highly focused event for test and electronics engineers that is dedicated to pre-compliance and compliance testing for EMC. Learn the latest on standards, equipment, setups and test techniques through free webinars.
Registration is Now Open for the Free Webinar, “How a New Scanning Technique Can Pinpoint Emissions from Inside an IC or Microchip in Minutes,” Presented by EMSCAN.
Overview: The very-near-field scanning method based on an array of probes provides real time visualization of the spatial distribution of emissions from PCBs but lack the ability to do very high resolution scanning. Single probe mechanically swept solutions can do very high resolution scanning but they are extremely slow. A new method that combines the array of sensors with mechanical motion combines the benefits of both techniques and provides the fastest high resolution scanning available. This presentation will show a working system that implements this combined technique and explain how the system is able to peer inside an IC and isolate the radiation from individual pins and wire bonds. Testing from real world PCBs with multiple sources of emission will be presented.
Learn more about EMC Live 2015 Test Bootcamp and register now.
