Dear readers, I have been really busy working in training and EMI troubleshooting in the past months. I am happy to be here again with a new post. This month we will see a topic from a real world situation very interesting for electronic designers working in conducted emissions problems. In one of the projects I was involved several weeks ago, a product was failing in … [Read more...]
About the Author
Arturo Mediano
Arturo Mediano received his M.Sc. (1990) and his PhD. (1997) in Electrical Engineering from University of Zaragoza (Spain), where he has held a teaching professorship in EMI/EMC/RF/SI from 1992. From 1990, he has been involved in R&D projects in EMI/EMC/SI/RF fields for communications, industry and scientific/medical applications with a solid experience in training, consultancy and troubleshooting for companies in Spain, USA, Switzerland, France, UK, Italy, Belgium, Germany, Canada, The Netherlands, Portugal, and Singapore. He is the founder of The HF-Magic Lab®, a specialized laboratory for design, diagnostic, troubleshooting, and training in the EMI/EMC/SI and RF fields at I3A (University of Zaragoza), and from 2011, he is an instructor for Besser Associates (CA, USA) offering public and on site courses in EMI/EMC/SI/RF subjects through the USA, especially in Silicon Valley/San Francisco Bay Area. He is Senior Member of the IEEE, active member from 1999 (Chair 2013-2016) of the MTT-17 (HF/VHF/UHF) Technical Committee of the Microwave Theory and Techniques Society and member of the Electromagnetic Compatibility Society. Arturo can be reached at a.mediano@ieee.org.
What You See With Near Field Probes (part 2) ….
In the second part of this topic I will explain how to understand the output of a square magnetic near field probe. My good friend Doug C. Smith explained me this idea many years ago and it is really useful for EMI troubleshooting. In my last post (June 2018), I reviewed the response of a magnetic near field probe. The conclusion was basically that the output voltage … [Read more...]
What You See With Near Field Probes
In EMI/EMC troubleshooting, near field probes (NFPs) are great tools. Let's review how to understand what you really see at the screen of your instrument with a magnetic near field probe. EMI/EMC problems (radiated and conducted emissions) are usually related with current in your circuits: high frequency currents (i.e. high di/dt currents) are responsible of radiation from … [Read more...]
Discovering FFT Gating
This month, I will explain one of the most useful functions you can find in the Rohde & Schwarz RTO family of digital scopes (Fig. 1): the FFT gating function. This is a function I like to use in the demonstrations included in many of my courses and seminars. Fig. 1. An RTO digital scope (photo courtesy R&S] The RTO family of digital scopes is ideal for EMI … [Read more...]
Review of the EMC Filters Kit from Würth Elektronik
Some weeks ago I received one unit of the EMC-Filter kit from Würth Elektronik (Order Code: 744998), a very nice and useful kit for industry and academia (Fig. 1). Fig. 1. The EMC-Filter kit from Würth Elektronik (Order Code: 744998) If you are interested in filtering conducted emissions, this is a great kit for evaluation of components and topologies in both differential … [Read more...]
Do Not Miss the EMC+SIPI 2018 Symposium!
I am really happy because this is my first EMI/EMC blog for Interference Technology. I was invited by Ken Wyatt to contribute periodically and it was really difficult to reject that invitation. Definitely, I am happy. I hope to be able to include in this blog interesting information for all of you because I am sure the new year will come with many EMI/EMC activities, events, … [Read more...]
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