For EMI / EMC Engineers
STMicroelectronics has produced a semiconductor wafer whose dice were fully tested without contact probes. ST’s innovative advance in testing technology enables a wafer containing chips such as RFID ICs to be tested using electromagnetic waves as the sole link to the array of circuits on the wafer. Contactless testing allows RF circuits to be tested under conditions that are close to the real application conditions.Learn more from STMicrolectronics.
Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.
