2012 EMC Symposium Computer Modeling & Simulation Demonstration
When: Tuesday, August 7th, 9:00 – 11:00 a.m.
Presenter: Joe Tannehill, ETS-Lindgren, Austin, Texas, USA
Automating the test process has the benefit of improving measurement accuracy and repeatability while also increasing test throughput. for those who wish to create their own software, many code development tools are available. However, there are also a number of commercially available software packages in which the software routines have already been developed and tested. This demonstration will show how instrument simulation can be used to model test results in an efficient and cost effective manner.
