This seminar is intended for engineers and technicians involved in the development, pre-compliance, testing and certification of electronic products, systems and assemblies.
Troubleshooting EMI with Lee Hill: Identify, Characterize, and Prevent Interference Problems
Title: Troubleshooting EMI with Lee Hill: Identify, Characterize, and Prevent Interference Problems
Date: March 17 2016
Location: Milpitas, California, USA
Description: Join this highly focused one-day seminar and learn how to uncover, characterize, and solve the most elusive EMI problems. Troubleshooting and localizing intermittent signals or multiple layers of broadband and narrowband signals can be frustrating even for the most seasoned EMC troubleshooter and RF engineer. We will discuss and demonstrate a number of test setups that can help identify hidden or emerging EMC failures and then demonstrate how real-time analysis can literally make previously-hidden signals leap into plain view.
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