Langer EMV-Technik GmbH has released new SX near-field probes with a frequency range up to 10 GHz enable EMC analysis of interference emitted by electronic boards, components and IC pins with high internal frequencies.
High clock rates of 2 GHz, says the company, may result in fifth order harmonics of up to 10 GHz. These harmonics are coupled out by RF sources on the board such as conductor run segments, ICs and other components. They may stimulate other structural parts of the board to oscillate and emit interferences.
The developer can use the SX near-field probes to detect RF sources that oscillate at a frequency of up to 10 GHz on the respective board and take appropriate counter-measures.
The SX probe head’s high resolution—SX R3-1 achieves 1 mm and SX E03 covers up to 4 x 4 mm—allows the developer to pinpoint RF sources on densely packed boards or on IC pins. The magnetic-field probe head is electrically-shielded. The probes are connected to the input of a spectrum analyser via a shielded cable and SMA connectors during the measurement.
