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IEEE SCV-EMC 2012 Mini-Symposium

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Title: IEEE SCV-EMC 2012 Mini-Symposium
Date: October 11 2012
Location: Santa Clara, CA
Description: The Santa Clara Valley Chapter of the EMC Society presents a one-day mini-symposium and exhibition on October 11, 2012 at the Biltmore Hotel Santa Clara. Topics of discussion will include the effects of electrostatic discharge (ESD) on equipment and effective troubleshooting techniques for combating ESD as well as the fundamentals of modeling, simulation and characterization techniques to ensure signal and power integrity. An afternoon reception will include an exhibition by vendors of EMC design, test and measurement products and services.
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Interference Technology

Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.

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