June 9, 2016: 6:30PM
MD, U.S.A.
“Join us for the DC/NoVA EMC/MTT chapter meeting that provides a discussion on the use of FFT technology for emission measurements present by Bill Wangard of Rohde & Schwarz. Although this is an IEEE chapter meeting, we invite all interested in this topic to attend.
The release of MIL-STD461G specifically states the use of FFT technology is allowed for EMI measurements. FFT technology not only brings significant improvement in speed, but also the ability to capture pulsed/intermittent signals. This presentation covers the technical details of Time Domain Scan and compares/contrasts the methodology to traditional Frequency Swept Spectrum Analyzers and the Frequency Stepped methodology of EMI Receivers. In addition, the presentation will give a brief introduction to real-time spectral analysis and discuss how it is changing the EMC measurement industry.
Bill Wangard is the EMI Receiver, Amplifier, and EMC Software Product Manager at Rohde & Schwarz. He has 20+ years of RF and Receiver experience at Motorola and Rohde & Schwarz. Bill authored numerous patents at Motorola and white papers at Rohde & Schwarz.
We need you to sign-up as soon as possible so plans for a light dinner (provided by Rohde & Schwarz) can be made. There is no charge for this event.”
Contact Kim Colbert [email protected] or (301-216-1500) to sign-up.
