IEC 60749-27:2006+A1:2012 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). The objective of the test is to provide reliable, repeatable ESD test results so that accurate classifications can be formed. This test method is applicable to all semiconductor devices and is classified as destructive. It may be used as an alternative test method to the human body model ESD test method. This consolidated version consists of the second edition (2006) and its amendment 1 (2012).
