On Nov. 20, 2013, Keith Armstrong will present a webinar on “Cost-effective use of close-field probing, in every project stage, for both emissions and immunity.”
Overview
This webinar – number 1 in a series of 2 – describes simple, low-cost, cost-effective, qualitative EMC bench-testing techniques for emissions and immunity, using close-field probes (that many people make themselves) and low-cost portable measuring instruments.
These practical techniques can be used in every stage of a product’s life cycle, from proof-of-principle to refurbishment, to:
• Save time
• Reduce overall costs
• Increase profitability
• Improve customer perception
– and so they save time and money overall whilst reducing financial risks.
Engineers who have learned to use close-field probing are more effective in their EMC work, and find it such a powerful technique that they never stop using it.
Content list for Part 1, November 2013
1) The many uses of close-field probing
2) Making your own close-field probes
3) Buying close-field probes, portable analysers, and ‘noise probes’
4) Current probes, pin probes, other useful types of probes
5) Using close-field probes
View Keith’s previous webinar series, “Understanding EMC Basics,” here.
