B&K Precision has released its new 2510 series handheld dual-channel digital storage oscilloscopes (DSO) that includes 60 MHz and 100 MHz bandwidth models in non-isolated and isolated designs. Models 2511 and 2512 provide non-isolated 300 V CAT II rated inputs and are suitable for general electronics, while models 2515 and 2516 provide two fully isolated 1,000 V CAT II / … [Read more...]
New Tool Detects and Traces Electromagnetic Attacks
With the ability to interfere with or damage electronic devices, electromagnetic pulses (EMP) are considered one of the most dangerous threats facing modern electronic systems and infrastructure. Man-made EMPs in particular can be used to deliberately disable power grids and defense and security systems without leaving any indication as to the specific nature or origin of the … [Read more...]
New Standard Gain Horn Antennas Operate Up to 40 GHz
Microwave and RF component supplier Fairview Microwave, Inc. has announced the expansion of its line of standard gain horn antennas to provide engineers with a more complete and comprehensive selection for various calibration and testing applications. The company has added seven new gain horn antenna designs ranging in size from WR28 to WR430 with frequencies from 1.7 GHz up … [Read more...]
Stand-Alone Generator for Slow Damped Oscillatory Wave Testing
Teseq, a provider of equipment for EMC emission and immunity testing, has released its new stand-alone generator for slow damped oscillatory wave testing in single phase equipment up to 270 V and 16 A. Ideal for use by power stations, substations, electric meter manufacturers, relays and switch manufacturers as well as EMC testing laboratories that already use Teseq equipment, … [Read more...]
View Our Webinar, Cost-Effective Use of Close-Field Probing Part I
This webinar – number 1 in a series of 2 – describes simple, low-cost, cost-effective, qualitative EMC bench-testing techniques for emissions and immunity, using close-field probes (that many people make themselves) and low-cost portable measuring instruments. These practical techniques can be used in every stage of a product’s life cycle, from proof-of-principle to … [Read more...]
Robot Arm Aids in High Frequency Antenna Calibration Breakthrough
A new antenna testing method from researchers at the Physical Measurement Laboratory (PML) in Colorado could lead to greater accuracy in the characterization and calibration of antennas for use at 50 GHz to 500 GHz. Currently, “there are no international reference standards for antennas at these frequencies,” team member David Novotny of the Radio-Frequency Fields Group in … [Read more...]
IEC 61290-3-3 ed1.0: Optical Amplifiers – Test Methods – Part 3-3: Noise Figure Parameters – Signal Power to total ASE Power Ratio
From the International Electrotechnical Commission webstore: "IEC 61290-3-3:2013 applies to all commercially available single channel optical amplifiers (OAs), including OAs using optically pumped fibres (OFAs) based on either rare-earth doped fibres or on the Raman effect, semiconductor optical amplifier modules (SOA modules) and planar optical waveguide amplifiers (POWAs). … [Read more...]
EMC Troubleshooting Tools and Techniques Webinar
Interference Technology will host a webinar, EMC Troubleshooting Tools and Techniques, Dec. 11, 2013 at 2 p.m. EST. Overview Failures during EMC product qualification testing can result in expensive delays and possible redesign. Understanding simple EMC design basics go a long way towards minimizing these risks. This webinar will review the most common design issues … [Read more...]
Using the Reverberation Chamber to Measure Total Radiated Power for EMF Assessments
NOTE: This article has been translated from Dutch to English. It can be found in its original language in the 2014 Europe EMC Guide. Konika Banerjee, Marcel van Doorn and Pierre Beeckman, Philips Innovation Services, Quality & Reliability Engineering - EMC Center, High Tech Campus 26, 5656 AE Eindhoven, The Netherlands ABSTRACT Multimedia products need to comply with … [Read more...]
Correction Factors of Near-Field Probes and How They Are Used in EMC
NOTE: This article has been translated from German to English. It can be found in its original language in the 2014 Europe EMC Guide. Dipl. Ing. Carsten Stange, LANGER EMV-Technik GmbH INTRODUCTION Langer EMV-Technik has been providing services to help eliminate interferences in electronic assemblies for 20 years. We have gained a wealth of experience in measuring … [Read more...]
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