The ESDALCxx family from STMicroelectronics is a new series of ESD protection diodes that are 67 percent smaller than previous generation options. Housed in a space-saving ST0201 package, these devices boast a minimal .18-mm2 footprint, allowing designers to select the optimum solder-pad pattern from available CAD component libraries quickly and easily. Specifically, the … [Read more...]
New Line of Filters Targets Portable Applications
The AOZ803x family of multi-line EMI filters from Alpha & Omega Semiconductor has been crafted to provide EMI/ESD protection in next-generation, portable handheld devices. These filters were designed using the company’s proprietary TVS2™ technology—i.e., Transient Voltage Suppression utilizing Trench Vertical Structures. This filter family features three products: the … [Read more...]
Slim Line EMI Filters Crafted to Ease Assembly and to Reduce Material Costs
The newly introduced 088 Series from LCR Electronics integrates a high attenuation EMI filter and IEC power entry socket with an illuminated power switch and either a fuse or a re-settable circuit breaker in one compact package, reducing the number of components that need to be fitted into a system. Initially developed for use in sports and fitness equipment, which typically … [Read more...]
First Edition Designer Kit Offers Wide Assortment of ESD Protection Diodes
An Electrostatic Discharge (ESD) Protection Diode Kit from OnChip Devices is intended to help designers reduce their time-to-market. The OC-ESD-K1 offers a wide assortment of ESD protection diodes for various applications such as high-speed I/O ports and systems that require 30-kV contact discharge protection when tested to IEC 61000 specifications. The integrated circuits and … [Read more...]
More Test Instrumentation Products
Portable EDS Tester Conforms Fully to Different Calibration RequirementsThe ESD3000 from HV Technologies is a lightweight, hand-held battery operated tester. Its modular construction enables testing to many different standards simply by changing the module. A broad range of accessories enables testing to many applications for contact discharge, air discharge, and indirect … [Read more...]
New 4-kV EMC Test System Complies with Latest IEC/EN Requirements
The NSG 3040 System generates electrical fast transient (EFT), surge, and power quality (PQT) tests. It easily fulfills CE Mark testing needs as it is fully compliant to the latest versions of IEC/EN 61000-4-4, -4-5, and -4-11. The NSG 3040 system can perform EFT tests to 4.8 kV and combination wave surges to 4.4 kV, and it can perform dip and interrupt testing. An internal … [Read more...]
Improving the Way We Measure Insertion Loss
A proposed set of new test methods may provide more accurate attenuation data Kermit O. Phipps, Philip F. Keebler, Bradford R. Connatser Many commercial and industrial electrical environments contain equipment that is sensitive to radio-frequency (RF) interference. Theft detectors, digital sensors, and medical-telemetry systems have all been known to malfunction in the … [Read more...]
Performing GR-1089-Core Lightning and Power Cross Test
A review of the test methodologies and equipment required to perform GR-1089-CORE lightning and power cross testing James Press, Jennifer Lawrence, Mark Betts, John Ngo ABSTRACT The pitfalls and difficulties in performing testing in accordance with GR-1089-CORE, Section 4 are discussed. A brief description of the GR-1089-CORE document is presented to familiarize the reader … [Read more...]
EMC in Space …
Successfully dealing with EMC in space systems requires strong EMC engineering Daryl Gerke, PE, and William Kimmel, PE Many of us in the EMC business came of age during the “space race” of the 1950s, 60s, and 70s. We well remember names like Sputnik, Mercury, Gemini, and of course, Apollo. Some of us in the EMC business have even been fortunate enough to spend some (or all) or … [Read more...]
Editorial in Medical Journal Calls for More Research on EMFs/Cell Phone/Brain Cancer Correlation
An editorial in the November issue of the journal Surgical Neurology has called for major immediate major research initiatives to assess the possibility that using cell phones leads to an increased risk of brain tumors. Dr. Ron Pawl, a neurosurgeon at Lake Forest Hospital in Lake Forest, IL calls for collaborative research initiatives to determine whether the risk between cell … [Read more...]
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