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Interference Technology

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New Micro Near Field Probes

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Langer-EMV released their new Type-MFA near field probes that are designed for high resolution (200 µm) applications. With MFA near-field probes, you are able to manually measure RF-currents from IC pins and signal wires (150µm). Because of the shape of the measuring coil (MFA-K 0.1-30 and MFA-K 0.1-12), magnetic field lines which would otherwise enter the head of the near-field probe are blocked. The MFA 01 set includes three near-field probes with a frequency range of 1 MHz up to 6 GHz.

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Interference Technology

Established in 1970, Interference Technology helps EMI/EMC engineers find solutions to their various testing, design, application and regulatory issues by publishing articles, news and other practical content. We help suppliers in these areas to find the right customers for their components, materials, test equipment and services through a wide range of marketing services, including lead generation, branding, market research and events. The publication is available in various printed and electronic media formats, with readers in over 60 countries. We also publish issues in local languages in China, Japan and Europe.

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