Semiconductor test equipment supplier Advantest Corporation has released its new T2000 8GWGD instrument, which incorporates both an 8 Gsps waveform generator and an 8 GHz digitizer into a single module for analog and mixed-signal system-on-chip (SoC) testing.
According to the company, the new T2000 platform is capable of handling “fast SerDes PHY-layer interfaces and complex, high-speed analog waveform challenges typically found in mass-storage SoCs.” Using an arbitrary wave generator, the new instrument can “source complex signals, including partial response maximum likelihood (PRML) waveforms and multi-tone waveforms with a wide range of frequencies for high-speed analog-to-digital converters and analog front-end devices, including preamplifiers.”
In addition, “the new module’s signal-capture digitizer is capable of enhancing system throughput and performing high-bandwidth analog measurements. Moreover, it provides test solutions for eye-diagram, rise/fall time and time propagation delay measurements as well as cycle-to-cycle and long-time jitter. This enables testing of high-speed digital-to-analog converters and preamplifiers, as well as fast digital-interface and phase-locked loop (PLL) devices,” the company said.
“Advantest has long dominated the SoC test market, testing more than half of the SoCs being manufactured today,” Hans-Juergen Wagner, senior vice president of SoC business group at Advantest Corp., said. “With this new tester, we are providing a solution for the fast-growing cloud computing market, which uses billions of hard disk drives to run massive server farms around the world.”
