Test and measurement equipment supplier Tektronix has released an automated transmitter (Tx) and receiver (Rx) compliance and debug testing solution for the PCI Express 3.0 standard. According to the company, the new compliance and debug testing solution is the industry’s “most integrated level of support for PHY layer test automation and debug of PCI Express 3.0.”
According to Brian Reich, general manager of performance oscilloscopes for Tektronix, by offering the new compliance and debug testing solution, the company is “making complex PCle3 testing easy while ensuring more consistent results.”
He adds that “long and complex tests such as stressed eye calibration and transmitter compliance testing don’t have to be performed by only senior engineers.”
PCle3 Rx testing is equipped with automated stressed pattern generation and includes support for clock multiplication and eye opening tests. DUT loopback control is also automated. PCle3 Tx testing now incorporates the PCI-SIG’s SigTest utility software for “compliance testing directly into its TekExpress automation framework on Tektronix DSA70000 Series digital oscilloscopes.” The new software also automates test instrumentation and DUT control, pattern validation and data acquisition.
