Agilent Technologies Inc. introduced the E6607B EXT wireless communications test set and companion E6617A multiport adapter to correspond with their attendance at the 2012 EMC Symposium in Pittsburgh, Pa. Optimized for non-signaling testing, the EXT/MPA combination increases test throughput and reduces the cost of test in the manufacturing of current- and next-generation smartphones and tablets that contain multiformat and multiband technologies.
The EXT is an integrated one-box tester that includes a vector signal analyzer, vector signal generator, high-speed sequence analyzer and multiformat hardware. It offers future-ready capabilities such as full cellular-band coverage up to 3.8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes implemented in the latest chipsets.
Visit Agilent Technolgies at Booth 917 at the 2012 EMC Symposium.
